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Sample Preparation
Applications
Cybersecurity: 14 nm node delayering
Photoemission: Visible Light Solid Immersion Lens
Simultaneous Thickness Measurement with NIR and VIS
Circuit Edit: < 2 um Remaining Silicon
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News
COVID19: Varioscale maintains its support for our customers through remote service and high priority tool repairs. We extend our support to all affected.
Visit Varioscale's publication library and learn what Varioscale and our partners have learned about Integrated Circuits.
Find out about the cutting edge systems Varioscale is developing right now.
Learn about our RAVEN project with IARPA
New tear-down lab construction finished
Visit our ISFTA 2020 booth in Pasadena CA this November
